Depth profile measurement of nonlinear dielectric properties in multilayer polarity inverted piezoelectric materials
【Abstract】
Currently, polarization-reversed layered structures are developed to improve the performance of piezoelectric devices. Scanning nonlinear dielectric microscopy (SNDM) can detect the polarization direction of piezoelectric and/or ferroelectric materials by measuring the nonlinear dielectric constant. The objective of this study is to obtain depth profile of polarity inversion in layered materials by controlling the distribution of the electric field in the sample nondestructively. In this report, we describe a method that the position of electrode is changed to control the electric field in the sample continuously, and the results of simulations.
【Keyword】
Piezoelectric material, Scanning nonlinear dielectric microscopy, Polarity inversion, Multilayer structure, Polarization measurement
【Products】
COMSOL Multiphysics, AC/DC Module